Steady-state IC thermal analysis with thermal decay curve characterization
US-12581913-B1 · Mar 17, 2026 · US
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Pan Hsiming patents
Pan Hsiming is listed as an inventor on 15 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Pan Hsiming |
| Total patents | 15 |
| First publication | Mar 3, 2020 |
| Latest publication | Mar 17, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Prediction of steady state heat maps for chip thermal analysis
US-12566909-B1 · Mar 3, 2026 · US
Systems and methods for machine learning based fast static thermal solver
US-2025173487-A1 · May 29, 2025 · US
Systems and methods for machine learning based fast static thermal solver
US-12242781-B2 · Mar 4, 2025 · US
Systems and methods for a comprehensive and efficient simulation-based methodology on IP authentication and trojan detection
US-11995187-B1 · May 28, 2024 · US
Systems and methods for machine learning based fast static thermal solver
US-2024078362-A1 · Mar 7, 2024 · US
Predicting on chip transient thermal response in a multi-chip system using an RNN-based predictor
US-11914931-B2 · Feb 27, 2024 · US
Systems and methods for machine learning based fast static thermal solver
US-11853661-B2 · Dec 26, 2023 · US
Systems and methods for machine learning based fast static thermal solver
US-2022277120-A1 · Sep 1, 2022 · US
Systems and methods for machine learning based fast static thermal solver
US-11366947-B2 · Jun 21, 2022 · US
Recent patents
Latest publications not already listed above.
Predicting on chip transient thermal response in a multi-chip system using an rnn-based predictor
US-2021200915-A1 · Jul 1, 2021 · US
Systems and methods for machine learning based fast static thermal solver
US-2021173983-A1 · Jun 10, 2021 · US
Calculating and extracting Joule-heating and self-heat induced temperature on wire segments for chip reliability
US-10970437-B2 · Apr 6, 2021 · US
Calculating and Extracting Joule-heating and Self-heat Induced Temperature on Wire Segments for Chip Reliability
US-2020159978-A1 · May 21, 2020 · US
Calculating and extracting joule-heating and self-heat induced temperature on wire segments for chip reliability
US-10579757-B1 · Mar 3, 2020 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Ansys Inc | 15 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F2119/08 | 14 |
| G06F2113/18 | 10 |
| G06F30/398 | 10 |
| G06F30/27 | 8 |
| G06F30/20 | 5 |