Built-in-self-test logic, memory device with same, and memory module testing method
US-12499961-B2 · Dec 16, 2025 · US
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Oh Eunhye patents
Oh Eunhye is listed as an inventor on 16 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Oh Eunhye |
| Total patents | 16 |
| First publication | Jun 3, 2021 |
| Latest publication | Dec 16, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Operating and testing semiconductor devices
US-12334170-B2 · Jun 17, 2025 · US
Built-in-self-test logic, memory device including built-in-self-test logic, and test method for memory module
US-2025191671-A1 · Jun 12, 2025 · US
Storage device including mapping memory and method of operating the same
US-2025068517-A1 · Feb 27, 2025 · US
Storage device including mapping memory and method of operating the same
US-12164376-B2 · Dec 10, 2024 · US
Built-in-self-test logic, memory device with same, and memory module testing method
US-2024021261-A1 · Jan 18, 2024 · US
Built-in self-test circuits and semiconductor integrated circuits including the same
US-11867757-B2 · Jan 9, 2024 · US
Operating and testing semiconductor devices
US-2024006008-A1 · Jan 4, 2024 · US
Built-in-self-test logic, memory device with same, and memory module testing method
US-11804276-B2 · Oct 31, 2023 · US
Semiconductor integrated circuit and method of testing the same
US-11698410-B2 · Jul 11, 2023 · US
Recent patents
Latest publications not already listed above.
Apparatus and method for writing data in a memory
US-11698852-B2 · Jul 11, 2023 · US
Storage device including mapping memory and method of operating the same
US-2023214297-A1 · Jul 6, 2023 · US
Built-in-self-test logic, memory device with same, and memory module testing method
US-2022293205-A1 · Sep 15, 2022 · US
Semiconductor integrated circuit and method of testing the same
US-2022206062-A1 · Jun 30, 2022 · US
Built-in self-test circuits and semiconductor integrated circuits including the same
US-2022187366-A1 · Jun 16, 2022 · US
Apparatus and method for writing data in a memory
US-2021165733-A1 · Jun 3, 2021 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 16 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G11C29/42 | 9 |
| G01R31/3187 | 8 |
| G11C29/36 | 7 |
| G11C29/4401 | 6 |
| G01R31/31724 | 6 |