System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection
US-10541104-B2 · Jan 21, 2020 · US
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Mizrahy Arnon patents
Mizrahy Arnon is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Mizrahy Arnon |
| Total patents | 2 |
| First publication | Jan 12, 2017 |
| Latest publication | Jan 21, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
System and method for scanning an object with an electron beam
US-2017011883-A1 · Jan 12, 2017 · US
Recent patents
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 2 |
| H01J2237/2813 | 2 |
| H01J2237/20221 | 2 |
| H01J37/265 | 2 |
| H01J37/147 | 2 |