System and method for optical wafer characterization with image up-sampling
US-12524867-B2 · Jan 13, 2026 · US
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Mcbride Patrick patents
Mcbride Patrick is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Mcbride Patrick |
| Total patents | 5 |
| First publication | Nov 25, 2021 |
| Latest publication | Jan 13, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Shot noise reduction using frame averaging
US-2023351553-A1 · Nov 2, 2023 · US
Mode selection and defect detection training
US-11769242-B2 · Sep 26, 2023 · US
System and method for optical wafer characterization with image up-sampling
US-2022383470-A1 · Dec 1, 2022 · US
Mode selection and defect detection training
US-2021366103-A1 · Nov 25, 2021 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Corp | 5 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 5 |
| G01N21/9501 | 5 |
| G01N21/8851 | 5 |
| G01N2021/8887 | 5 |
| H10P74/203 | 3 |