Prediction and metrology of stochastic photoresist thickness defects
US-12406197-B2 · Sep 2, 2025 · US
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Li Xiaohan patents
Li Xiaohan is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Li Xiaohan |
| Total patents | 7 |
| First publication | Apr 28, 2022 |
| Latest publication | Sep 2, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Systems and methods for relation labelling pipeline
US-2025245426-A1 · Jul 31, 2025 · US
Systems and methods for optimal large language model ensemble attribute extraction
US-2025245246-A1 · Jul 31, 2025 · US
Lithography mask repair by simulation of photoresist thickness evolution
US-11966156-B2 · Apr 23, 2024 · US
Lithography mask repair by simulation of photoresist thickness evolution
US-2024061327-A1 · Feb 22, 2024 · US
Authentication of trusted users
US-2024048545-A1 · Feb 8, 2024 · US
Prediction and metrology of stochastic photoresist thickness defects
US-2022129775-A1 · Apr 28, 2022 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Corp | 4 |
| Walmart Apollo Llc | 2 |
| Microsoft Technology Licensing Llc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.