Quality control method for optometric measurements
US-9974435-B2 · May 22, 2018 · US
Levraud Loic is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Levraud Loic |
| Total patents | 5 |
| First publication | May 5, 2016 |
| Latest publication | May 22, 2018 |
Publications ranked by popularity score, then publication date.
US-9974435-B2 · May 22, 2018 · US
US-9703122-B2 · Jul 11, 2017 · US
US-9625743-B2 · Apr 18, 2017 · US
US-2016353985-A1 · Dec 8, 2016 · US
US-2016124249-A1 · May 5, 2016 · US
Latest publications not already listed above.
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Essilor Int | 5 |
| Essilor Int Compagnie General Doptique | 1 |
| Levraud Loic | 1 |
| Leguy Dominique | 1 |
| Lazuka-Nicoulaud Eva | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G02C13/005 | 4 |
| A61B3/0025 | 4 |
| G02C13/003 | 3 |
| A61B5/0022 | 2 |
| A61B3/11 | 2 |