Generation of synthetic fault images of semiconductor specimens
US-2026094310-A1 · Apr 2, 2026 · US
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Levant Boris patents
Levant Boris is listed as an inventor on 27 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Levant Boris |
| Total patents | 27 |
| First publication | Feb 22, 2018 |
| Latest publication | Apr 2, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Machine learning based generation of synthetic fault images of semiconductor specimens
US-2026087612-A1 · Mar 26, 2026 · US
Augmented chemical mechanical planarization
US-2026082866-A1 · Mar 19, 2026 · US
Image augmentation for machine learning based defect examination
US-12573024-B2 · Mar 10, 2026 · US
Machine learning based examination for process monitoring
US-12561793-B2 · Feb 24, 2026 · US
Methods and systems enabling determination of a depth profile of a semiconductor specimen
US-2026024186-A1 · Jan 22, 2026 · US
End-to-end measurement for semiconductor specimens
US-12489020-B2 · Dec 2, 2025 · US
Machine learning based yield prediction
US-12469124-B2 · Nov 11, 2025 · US
Detecting a defective nozzle in a digital printing system
US-12214601-B2 · Feb 4, 2025 · US
Machine learning based defect examination for semiconductor specimens
US-2024428396-A1 · Dec 26, 2024 · US
Recent patents
Latest publications not already listed above.
Optimal determination of an overlay target using machine learning
US-2024289940-A1 · Aug 29, 2024 · US
Machine learning based yield prediction
US-2024281958-A1 · Aug 22, 2024 · US
Machine learning based examination for process monitoring
US-2024281956-A1 · Aug 22, 2024 · US
End-to-end measurement for semiconductor specimens
US-2024105522-A1 · Mar 28, 2024 · US
Image augmentation for machine learning based defect examination
US-2024095903-A1 · Mar 21, 2024 · US
Detecting a defective nozzle in a digital printing system
US-2023264483-A1 · Aug 24, 2023 · US
Correcting registration errors in digital printing
US-11630618-B2 · Apr 18, 2023 · US
Time-domain optical metrology and inspection of semiconductor devices
US-2022390858-A1 · Dec 8, 2022 · US
Time-domain optical metrology and inspection of semiconductor devices
US-11366398-B2 · Jun 21, 2022 · US
Correcting registration errors in digital printing
US-2022188050-A1 · Jun 16, 2022 · US
Correcting registration errors in digital printing
US-11321028-B2 · May 3, 2022 · US
Time-domain optical metrology and inspection of semiconductor devices
US-2021247699-A1 · Aug 12, 2021 · US
Correcting registration errors in digital printing
US-2021182001-A1 · Jun 17, 2021 · US
Method and system for optical metrology in patterned structures
US-10761036-B2 · Sep 1, 2020 · US
Method and system for optical metrology in patterned structures
US-2019317024-A1 · Oct 17, 2019 · US
Method and system for optical metrology in patterned structures
US-10274435-B2 · Apr 30, 2019 · US
Method and system for optical metrology in patterned structures
US-2018052119-A1 · Feb 22, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 14 |
| Landa Corp Ltd | 6 |
| Nova Measuring Instr Ltd | 5 |
| Nova Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/20081 | 18 |
| G06T2207/20084 | 18 |
| G06T7/0004 | 14 |
| G06T2207/30148 | 13 |
| H10P74/203 | 12 |