System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection
US-10541104-B2 · Jan 21, 2020 · US
This page is not indexed by search engines while we improve data quality.
Lev Uri patents
Lev Uri is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lev Uri |
| Total patents | 4 |
| First publication | Jan 12, 2017 |
| Latest publication | Jan 21, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
Imaging of crystalline defects
US-10347462-B2 · Jul 9, 2019 · US
Imaging of crystalline defects
US-2019180975-A1 · Jun 13, 2019 · US
System and method for scanning an object with an electron beam
US-2017011883-A1 · Jan 12, 2017 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J2237/2813 | 4 |
| H01J37/28 | 4 |
| H01J37/222 | 2 |
| H01J2237/24475 | 2 |
| G01N23/203 | 2 |