Bandgap measurements of patterned film stacks using spectroscopic metrology
US-11796390-B2 · Oct 24, 2023 · US
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Lesoine John patents
Lesoine John is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lesoine John |
| Total patents | 7 |
| First publication | Jan 2, 2018 |
| Latest publication | Oct 24, 2023 |
Notable patents
Publications ranked by popularity score, then publication date.
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology
US-2022349752-A1 · Nov 3, 2022 · US
Bandgap measurements of patterned film stacks using spectroscopic metrology
US-11378451-B2 · Jul 5, 2022 · US
Metrology system calibration refinement
US-10605722-B2 · Mar 31, 2020 · US
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology
US-2019041266-A1 · Feb 7, 2019 · US
Metrology system calibration refinement
US-2018100796-A1 · Apr 12, 2018 · US
Metrology system calibration refinement
US-9857291-B2 · Jan 2, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 5 |
| Kla Corp | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.