Pulse electron microscope device and inspection method using the same
US-2026072080-A1 · Mar 12, 2026 · US
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Lee Suyoung patents
Lee Suyoung is listed as an inventor on 85 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lee Suyoung |
| Total patents | 85 |
| First publication | Mar 17, 2015 |
| Latest publication | Mar 12, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
System, device and method of controlling emission current of electron microscope
US-2026058091-A1 · Feb 26, 2026 · US
Semiconductor inspection apparatus and method of manufacturing semiconductor device using the same
US-2025244259-A1 · Jul 31, 2025 · US
Wafer inspection method
US-2025231121-A1 · Jul 17, 2025 · US
Semiconductor inspection apparatus and semiconductor inspection method using the same
US-12362139-B2 · Jul 15, 2025 · US
Substrate inspection apparatus and substrate inspection method
US-12352808-B2 · Jul 8, 2025 · US
Scanning electron microscope device
US-2025218721-A1 · Jul 3, 2025 · US
Shoe management device
US-12268790-B2 · Apr 8, 2025 · US
Method of generating defect classification model
US-2025037486-A1 · Jan 30, 2025 · US
Optical imaging device
US-2025027875-A1 · Jan 23, 2025 · US
Recent patents
Latest publications not already listed above.
Method of inspecting defects
US-2025014169-A1 · Jan 9, 2025 · US
Shoe management device
US-2025001027-A1 · Jan 2, 2025 · US
Substrate inspection method
US-2024412943-A1 · Dec 12, 2024 · US
Random sampling-based collective classification method and system for sybil account detection
US-2024403389-A1 · Dec 5, 2024 · US
Shoe management device
US-12121619-B2 · Oct 22, 2024 · US
Natural killer t cell ligand loaded extracellular nanovesicle and autologous anti-cancer vaccine for hematologic malignancies comprising the same
US-2024189406-A1 · Jun 13, 2024 · US
Substrate inspection apparatus and substrate inspection method
US-2024175915-A1 · May 30, 2024 · US
Shoe management device
US-2024173445-A1 · May 30, 2024 · US
Electronic device including processing circuit for generating depth information using luminance data and method of generating depth information
US-11978223-B2 · May 7, 2024 · US
Shoe management device
US-11931471-B2 · Mar 19, 2024 · US
Beverage making system
US-2023383219-A1 · Nov 30, 2023 · US
Inspection apparatus for inspecting semiconductor devices using charged particles
US-11754517-B2 · Sep 12, 2023 · US
Method of inspecting semiconductor device
US-2023266258-A1 · Aug 24, 2023 · US
Image processing device for noise reduction using dual conversion gain and operation method thereof
US-11722795-B2 · Aug 8, 2023 · US
Semiconductor inspection apparatus and semiconductor inspection method using the same
US-2023197402-A1 · Jun 22, 2023 · US
Application processor, electronic device including the same and operation method of the electronic device
US-11683466-B2 · Jun 20, 2023 · US
Apparatus for stabilizing digital image, operating method thereof, and electronic device having the same
US-11611708-B2 · Mar 21, 2023 · US
Shoe care device
US-D978521-S · Feb 21, 2023 · US
Wine dispenser
US-D975486-S · Jan 17, 2023 · US
Image processing device for noise reduction using dual conversion gain and operation method thereof
US-2022417457-A1 · Dec 29, 2022 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Lg Electronics Inc | 53 |
| Samsung Electronics Co Ltd | 29 |
| Korea Advanced Inst Sci & Tech | 2 |
| Seoul Nat Univ R&Db Foundation | 1 |
| Samsung Electronics Co Ltd Suwon Si | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F3/0488 | 27 |
| G06F3/04883 | 27 |
| H04M2250/22 | 19 |
| G06F3/04817 | 19 |
| G06F3/0482 | 17 |