Digital droop detector, semiconductor device including the same, and calibration method thereof
US-12057844-B2 · Aug 6, 2024 · US
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Lee Heejune patents
Lee Heejune is listed as an inventor on 6 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lee Heejune |
| Total patents | 6 |
| First publication | Jun 16, 2022 |
| Latest publication | Aug 6, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Digital droop detector, semiconductor device including the same, and calibration method thereof
US-2024072782-A1 · Feb 29, 2024 · US
Built-in self-test circuits and semiconductor integrated circuits including the same
US-11867757-B2 · Jan 9, 2024 · US
Semiconductor integrated circuit and method of testing the same
US-11698410-B2 · Jul 11, 2023 · US
Semiconductor integrated circuit and method of testing the same
US-2022206062-A1 · Jun 30, 2022 · US
Built-in self-test circuits and semiconductor integrated circuits including the same
US-2022187366-A1 · Jun 16, 2022 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 6 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/3187 | 4 |
| H03M1/66 | 4 |
| G01R31/31703 | 4 |
| H03K5/13 | 2 |
| H03K5/125 | 2 |