Particle beam device comprising an electrode unit
US-9312093-B1 · Apr 12, 2016 · US
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Lechner Lorenz patents
Lechner Lorenz is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lechner Lorenz |
| Total patents | 5 |
| First publication | Jan 15, 2015 |
| Latest publication | Apr 12, 2016 |
Notable patents
Publications ranked by popularity score, then publication date.
Method of operating a particle beam microscope and a particle beam microscope
US-9140656-B2 · Sep 22, 2015 · US
TEM-lamella, process for its manufacture, and apparatus for executing the process
US-9103753-B2 · Aug 11, 2015 · US
Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
US-2015028225-A1 · Jan 29, 2015 · US
Method of operating a particle beam microscope and a particle beam microscope
US-2015014528-A1 · Jan 15, 2015 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Zeiss Carl Microscopy Gmbh | 5 |
| Lechner Lorenz | 1 |
| Kaiser Ute | 1 |
| Biskupek Johannes | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/026 | 2 |
| H01J37/28 | 2 |
| G01N23/2251 | 2 |
| H01J2237/045 | 2 |
| H01J37/20 | 2 |