Spectrometer including tunable on-chip laser and spectrum measurement method
US-12350013-B2 · Jul 8, 2025 · US
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Lantsov Alexey Dmitrievich patents
Lantsov Alexey Dmitrievich is listed as an inventor on 17 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lantsov Alexey Dmitrievich |
| Total patents | 17 |
| First publication | Oct 1, 2015 |
| Latest publication | Jul 8, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
System, computing device, and method for extraction of optical properties of turbid medium by using diffuse reflectometry
US-11353398-B2 · Jun 7, 2022 · US
System, computing device, and method for extraction of optical properties of turbid medium by using diffuse reflectometry
US-2021262932-A1 · Aug 26, 2021 · US
Physiological parameter detecting apparatus and method of detecting physiological parameters
US-11045103-B2 · Jun 29, 2021 · US
Spectrometer including tunable on-chip laser and spectrum measurement method
US-2021121068-A1 · Apr 29, 2021 · US
Apparatus for and method of measuring blood pressure
US-10405806-B2 · Sep 10, 2019 · US
Device and method for biometrics authentication
US-10296776-B2 · May 21, 2019 · US
Optical dual-comb source apparatuses including optical microresonator
US-10224688-B2 · Mar 5, 2019 · US
Laser speckle interferometric system and method for mobile devices
US-10206576-B2 · Feb 19, 2019 · US
Optical dual-comb source apparatuses including optical microresonator
US-2018351319-A1 · Dec 6, 2018 · US
Recent patents
Latest publications not already listed above.
Physiological parameter detecting apparatus and method of detecting physiological parameters
US-2017311820-A1 · Nov 2, 2017 · US
Device and method for biometrics authentication
US-2017286741-A1 · Oct 5, 2017 · US
Apparatus for and method of measuring blood pressure
US-2016256116-A1 · Sep 8, 2016 · US
Method and device for measuring critical dimension of nanostructure
US-9400254-B2 · Jul 26, 2016 · US
Optical measuring system and method of measuring critical size
US-9322640-B2 · Apr 26, 2016 · US
Laser speckle interferometric system and method for mobile devices
US-2016066790-A1 · Mar 10, 2016 · US
Method and device for measuring critical dimension of nanostructure
US-2015276378-A1 · Oct 1, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 17 |
| International Center For Quantum Optics & Quantum Tech Limited Liability Company | 2 |
| Samsing Electronics Co Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| A61B5/0059 | 6 |
| A61B5/14552 | 6 |
| A61B5/681 | 4 |
| A61B2562/0233 | 4 |
| A61B2560/0475 | 4 |