Computational wafer inspection
US-2018365369-A1 · Dec 20, 2018 · US
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Koonmen James Patrick patents
Koonmen James Patrick is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Koonmen James Patrick |
| Total patents | 1 |
| First publication | Dec 20, 2018 |
| Latest publication | Dec 20, 2018 |
Notable patents
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Recent patents
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Asml Netherlands Bv | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/23 | 1 |
| G06N7/01 | 1 |
| G03F7/70525 | 1 |
| G03F7/7065 | 1 |
| G06F30/20 | 1 |