Laser marking focus feedback system having an intensity indication of reflected radiation passed through an objective lens, a beam splitter and a pinhole
US-10916462-B2 · Feb 9, 2021 · US
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Kapp Daniel patents
Kapp Daniel is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Kapp Daniel |
| Total patents | 4 |
| First publication | Mar 29, 2018 |
| Latest publication | Feb 9, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Laser marking focus feedback system
US-2019122912-A1 · Apr 25, 2019 · US
Defect marking for semiconductor wafer inspection
US-10082470-B2 · Sep 25, 2018 · US
Defect Marking For Semiconductor Wafer Inspection
US-2018088056-A1 · Mar 29, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P72/0614 | 4 |
| G01N21/956 | 2 |
| G01N1/44 | 2 |
| G01N1/286 | 2 |
| G01N2021/888 | 2 |