Probe assessment method and spm
US-2024069064-A1 · Feb 29, 2024 · US
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Iida Eiji patents
Iida Eiji is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Iida Eiji |
| Total patents | 7 |
| First publication | Oct 17, 2019 |
| Latest publication | Feb 29, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Scanning probe microscope and cantilever moving method
US-10794931-B2 · Oct 6, 2020 · US
Scanning probe microscope
US-10641790-B2 · May 5, 2020 · US
Scanning probe microscope and light intensity adjusting method
US-10598691-B2 · Mar 24, 2020 · US
Scanning probe microscope and light intensity adjusting method
US-2019331711-A1 · Oct 31, 2019 · US
Scanning probe microscope
US-2019324053-A1 · Oct 24, 2019 · US
Scanning probe microscope and cantilever moving method
US-2019317124-A1 · Oct 17, 2019 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Shimadzu Corp | 7 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01Q30/00 | 4 |
| G01Q20/02 | 4 |
| G01Q10/065 | 4 |
| G01Q60/00 | 2 |
| G01Q30/18 | 2 |