Method to measure light loss of optical films and optical substrates
US-12140494-B2 · Nov 12, 2024 · US
Hayee Fariah is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Hayee Fariah |
| Total patents | 5 |
| First publication | Sep 15, 2022 |
| Latest publication | Nov 12, 2024 |
Publications ranked by popularity score, then publication date.
US-12140494-B2 · Nov 12, 2024 · US
US-12110582-B2 · Oct 8, 2024 · US
US-2024125670-A1 · Apr 18, 2024 · US
US-11892367-B2 · Feb 6, 2024 · US
US-2022291083-A1 · Sep 15, 2022 · US
Latest publications not already listed above.
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 5 |
| Ohno Kenichi | 1 |
| KURATOMI Takashi | 1 |
| Hayee Fariah | 1 |
| Ceballos Andrew | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01M11/35 | 4 |
| G01N21/958 | 4 |
| G01M11/0285 | 4 |
| G01M11/0207 | 4 |
| G01N2021/9511 | 4 |