Image measuring method and apparatus
US-11257205-B2 · Feb 22, 2022 · US
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Hanamura Takashi patents
Hanamura Takashi is listed as an inventor on 10 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Hanamura Takashi |
| Total patents | 10 |
| First publication | Jan 21, 2016 |
| Latest publication | Feb 22, 2022 |
Notable patents
Publications ranked by popularity score, then publication date.
Hardness test apparatus and hardness testing method
US-10163201-B2 · Dec 25, 2018 · US
Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program
US-10102631-B2 · Oct 16, 2018 · US
Image measuring apparatus
US-10027885-B2 · Jul 17, 2018 · US
Image measuring method and image measuring device
US-2017178315-A1 · Jun 22, 2017 · US
Hardness test apparatus and hardness testing method
US-2017076436-A1 · Mar 16, 2017 · US
Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program
US-2016295207-A1 · Oct 6, 2016 · US
Image measurement apparatus and guidance display method of image measurement apparatus
US-2016093068-A1 · Mar 31, 2016 · US
Image measuring apparatus
US-2016021306-A1 · Jan 21, 2016 · US
Image measuring apparatus
US-2016019687-A1 · Jan 21, 2016 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Mitutoyo Corp | 10 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30164 | 5 |
| H04N5/23293 | 4 |
| G01B11/00 | 4 |
| G06T7/001 | 4 |
| H04N5/23229 | 3 |