Method and system for measuring interference in a checkweighing device
US-11846539-B2 · Dec 19, 2023 · US
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Han Qi patents
Han Qi is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Han Qi |
| Total patents | 3 |
| First publication | Apr 24, 2018 |
| Latest publication | Dec 19, 2023 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and system for measuring interference in a checkweighing device
US-2021372847-A1 · Dec 2, 2021 · US
System on chip and corresponding monitoring method
US-9952963-B2 · Apr 24, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Mettler Toledo Changzhou Prec Instruments Ltd | 2 |
| Mettler Toledo Changzhou Measurement Technology Ltd | 2 |
| Mettler Toledo Int Trading Shanghai Co Ltd | 2 |
| Huawei Tech Co Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01G23/01 | 2 |
| G01G15/006 | 2 |
| G01G19/03 | 2 |
| G01G23/10 | 2 |
| G01G11/006 | 2 |