X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
US-9222900-B2 · Dec 29, 2015 · US
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Feser Michael patents
Feser Michael is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Feser Michael |
| Total patents | 1 |
| First publication | Dec 29, 2015 |
| Latest publication | Dec 29, 2015 |
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Univ Danmarks Tekniske | 1 |
| Danmarks Tekniske Uni Of Anker Engelundsvej | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N2223/605 | 1 |
| G01N2223/648 | 1 |
| G01N2223/056 | 1 |
| G01N23/207 | 1 |
| G01N23/205 | 1 |