Z-profiling of wafers based on X-ray measurements
US-12480898-B2 · Nov 25, 2025 · US
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Eilon Michal patents
Eilon Michal is listed as an inventor on 12 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Eilon Michal |
| Total patents | 12 |
| First publication | Feb 26, 2019 |
| Latest publication | Nov 25, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurements
US-2025231132-A1 · Jul 17, 2025 · US
Nondestructive estimation of structural properties of a specimen via x-ray modelling based on simulations and ground truth measurements
US-2025216347-A1 · Jul 3, 2025 · US
Non-destructive three-dimensional probing and characterization of specimens
US-2025130185-A1 · Apr 24, 2025 · US
Non-destructive classification of specimens based on energy signature measurements
US-2024255449-A1 · Aug 1, 2024 · US
Non-destructive sem-based depth-profiling of samples
US-2024094150-A1 · Mar 21, 2024 · US
Non-destructive sem-based depth-profiling of samples
US-2024096591-A1 · Mar 21, 2024 · US
Z-profiling of wafers based on x-ray measurements
US-2024085356-A1 · Mar 14, 2024 · US
Depth-profiling of samples based on x-ray measurements
US-2024085351-A1 · Mar 14, 2024 · US
Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber
US-11049704-B1 · Jun 29, 2021 · US
Recent patents
Latest publications not already listed above.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 12 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N23/2252 | 7 |
| G01N2223/305 | 5 |
| G01N2223/079 | 4 |
| G01N2223/633 | 4 |
| G01N2223/6116 | 4 |