Wafer probe alignment
US-9977053-B2 · May 22, 2018 · US
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DENGLER Eberhard patents
DENGLER Eberhard is listed as an inventor on 6 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | DENGLER Eberhard |
| Total patents | 6 |
| First publication | Apr 20, 2017 |
| Latest publication | May 22, 2018 |
Notable patents
Publications ranked by popularity score, then publication date.
Wafer probe alignment
US-9927463-B2 · Mar 27, 2018 · US
Auto-alignment of backer plate for direct docking test boards
US-9921268-B2 · Mar 20, 2018 · US
Auto-alignment of backer plate for direct docking test boards
US-2017139003-A1 · May 18, 2017 · US
Wafer probe alignment
US-2017108547-A1 · Apr 20, 2017 · US
Wafer probe alignment
US-2017108534-A1 · Apr 20, 2017 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| IBM | 6 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2887 | 6 |
| G01R31/2891 | 6 |
| G01R1/06794 | 6 |
| G01R1/07307 | 4 |
| G01R1/07342 | 1 |