Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2025264813-A1 · Aug 21, 2025 · US
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Deckers David patents
Deckers David is listed as an inventor on 15 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Deckers David |
| Total patents | 15 |
| First publication | Mar 17, 2015 |
| Latest publication | Aug 21, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-12287584-B2 · Apr 29, 2025 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-11940740-B2 · Mar 26, 2024 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2024019788-A1 · Jan 18, 2024 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2022326623-A1 · Oct 13, 2022 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-11385550-B2 · Jul 12, 2022 · US
Methods & apparatus for obtaining diagnostic information relating to an industrial process
US-2020264520-A1 · Aug 20, 2020 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-10642162-B2 · May 5, 2020 · US
Methods and apparatus for obtaining diagnostic information relating to an industrial process
US-2019278188-A1 · Sep 12, 2019 · US
Measuring method, apparatus and substrate
US-10151987-B2 · Dec 11, 2018 · US
Recent patents
Latest publications not already listed above.
Alignment measurement system, lithographic apparatus, and a method to determine alignment of in a lithographic apparatus
US-9280057-B2 · Mar 8, 2016 · US
Alignment Measurement System, Lithographic Apparatus, and a Method to Determine Alignment of in a Lithographic Apparatus
US-2015261100-A1 · Sep 17, 2015 · US
Alignment measurement system, lithographic apparatus, and a method to determine alignment in a lithographic apparatus
US-9046385-B2 · Jun 2, 2015 · US
Alignment mark, substrate, set of patterning devices, and device manufacturing method
US-9025148-B2 · May 5, 2015 · US
Alignment mark deformation estimating method, substrate position predicting method, alignment system and lithographic apparatus
US-8982347-B2 · Mar 17, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Asml Netherlands Bv | 16 |
| Deckers David | 3 |
| Bijnen Franciscus Godefridus Casper | 2 |
| Musa Sami | 2 |
| Asml Netherlands N V | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/70633 | 11 |
| G03F7/70625 | 10 |
| G03F9/7092 | 9 |
| G03F7/70508 | 9 |
| G06F16/26 | 9 |