Methods for testing integrated circuits of wafer and testing structures for integrated circuits
US-9269642-B2 · Feb 23, 2016 · US
Coster Michael T is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Coster Michael T |
| Total patents | 1 |
| First publication | Feb 23, 2016 |
| Latest publication | Feb 23, 2016 |
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Globalfoundries Inc | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10W20/20 | 1 |
| H10P74/207 | 1 |
| H01L23/481 | 1 |
| H01L2924/0002 | 1 |
| H01L2924/00 | 1 |