Optical critical dimensions (ocd) metrology for thick stacks
US-2025389530-A1 · Dec 25, 2025 · US
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Cohen Oded patents
Cohen Oded is listed as an inventor on 27 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Cohen Oded |
| Total patents | 27 |
| First publication | May 25, 2017 |
| Latest publication | Dec 25, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Machine and deep learning methods for spectra-based metrology and process control
US-2025334887-A1 · Oct 30, 2025 · US
Metrology and process control for semiconductor manufacturing
US-2025181941-A1 · Jun 5, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-12321102-B2 · Jun 3, 2025 · US
Metrology and process control for semiconductor manufacturing
US-12236364-B2 · Feb 25, 2025 · US
Machine and deep learning methods for spectra-based metrology and process control
US-2024310737-A1 · Sep 19, 2024 · US
Metrology and process control for semiconductor manufacturing
US-2024078450-A1 · Mar 7, 2024 · US
Machine and deep learning methods for spectra-based metrology and process control
US-11815819-B2 · Nov 14, 2023 · US
Metrology and process control for semiconductor manufacturing
US-11763181-B2 · Sep 19, 2023 · US
Test structure design for metrology measurements in patterned samples
US-11639901-B2 · May 2, 2023 · US
Recent patents
Latest publications not already listed above.
Machine and deep learning methods for spectra-based metrology and process control
US-2023124431-A1 · Apr 20, 2023 · US
Methods of regenerating and transforming cannabis
US-2022386547-A1 · Dec 8, 2022 · US
Methods of controlling cannabinoid synthesis in plants or cells and plants and cells produced thereby
US-2022298522-A1 · Sep 22, 2022 · US
Test structure design for metrology measurements in patterned samples
US-2022099596-A1 · Mar 31, 2022 · US
Metrology and process control for semiconductor manufacturing
US-2022036218-A1 · Feb 3, 2022 · US
Methods of regenerating and transforming cannabis
US-2021337753-A1 · Nov 4, 2021 · US
Test structure design for metrology measurements in patterned samples
US-11143601-B2 · Oct 12, 2021 · US
Metrology and process control for semiconductor manufacturing
US-11093840-B2 · Aug 17, 2021 · US
Nucleic acid constructs and methods of using same
US-2021171965-A1 · Jun 10, 2021 · US
Metrology and process control for semiconductor manufacturing
US-2021150387-A1 · May 20, 2021 · US
Test structure design for metrology measurements in patterned samples
US-2020057005-A1 · Feb 20, 2020 · US
Metrology test structure design and measurement scheme for measuring in patterned structures
US-10359369-B2 · Jul 23, 2019 · US
Test structure for use in metrology measurements of patterns
US-10216098-B2 · Feb 26, 2019 · US
Test structure for use in metrology measurements of patterns
US-2017363970-A1 · Dec 21, 2017 · US
Creating and using profiles from surveillance records
US-2017357662-A1 · Dec 14, 2017 · US
Metrology test structure design and measurement scheme for measuring in patterned structures
US-2017227474-A1 · Aug 10, 2017 · US
Test structure design for metrology measurements in patterned samples
US-2017146465-A1 · May 25, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Nova Ltd | 14 |
| Nova Measuring Instr Ltd | 8 |
| The State Of Israel Ministry Of Agriculture & Rural Development Agricultural Res Organization | 4 |
| Aro Volcani Center | 1 |
| Verint Systems Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/70616 | 17 |
| G01B2210/56 | 14 |
| G01N21/956 | 12 |
| G03F7/705 | 12 |
| G03F7/706841 | 12 |