Specimen preparation and inspection in a dual-beam charged particle microscope
US-10629409-B2 · Apr 21, 2020 · US
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Bosák Daniel patents
Bosák Daniel is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Bosák Daniel |
| Total patents | 2 |
| First publication | Apr 11, 2019 |
| Latest publication | Apr 21, 2020 |
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J2237/20242 | 2 |
| H01J37/3056 | 2 |
| H01J2237/31745 | 2 |
| H01J2237/31749 | 2 |
| H01J37/244 | 2 |