Sample inspection with multiple measurement modes
US-12535431-B2 · Jan 27, 2026 · US
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Biellak Stephen patents
Biellak Stephen is listed as an inventor on 33 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Biellak Stephen |
| Total patents | 33 |
| First publication | Jul 21, 2015 |
| Latest publication | Jan 27, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Sample inspection with multiple measurement modes
US-2025264414-A1 · Aug 21, 2025 · US
Systems and methods for advanced defect ablation protection
US-11181484-B1 · Nov 23, 2021 · US
Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die
US-10923526-B2 · Feb 16, 2021 · US
Image sensors with grounded or otherwise biased channel-stop contacts
US-10903258-B2 · Jan 26, 2021 · US
Spread-spectrum clock-signal adjustment for image sensors
US-10734438-B2 · Aug 4, 2020 · US
Radiation-induced false count mitigation and detector cooling
US-10690599-B1 · Jun 23, 2020 · US
Wafer inspection
US-10488348-B2 · Nov 26, 2019 · US
Dark-field inspection using a low-noise sensor
US-10462391-B2 · Oct 29, 2019 · US
Multi-Pass Imaging Using Image Sensors with Variably Biased Channel-Stop Contacts
US-2019288028-A1 · Sep 19, 2019 · US
Recent patents
Latest publications not already listed above.
Spread-Spectrum Clock-Signal Adjustment for Image Sensors
US-2019288019-A1 · Sep 19, 2019 · US
Image Sensors with Grounded or Otherwise Biased Channel-Stop Contacts
US-2019109163-A1 · Apr 11, 2019 · US
System and method for reducing radiation-induced false counts in an inspection system
US-10241217-B2 · Mar 26, 2019 · US
Wafer Inspection
US-2018164228-A1 · Jun 14, 2018 · US
Wafer inspection
US-9915622-B2 · Mar 13, 2018 · US
System and Method for Reducing Radiation-Induced False Counts in an Inspection System
US-2018045837-A1 · Feb 15, 2018 · US
TDI sensor in a darkfield system
US-9891177-B2 · Feb 13, 2018 · US
System and method for reducing radiation-induced false counts in an inspection system
US-9841512-B2 · Dec 12, 2017 · US
Laser with integrated multi line or scanning beam capability
US-9678350-B2 · Jun 13, 2017 · US
Image intensifier tube design for aberration correction and ion damage reduction
US-9666419-B2 · May 30, 2017 · US
Detection of selected defects in relatively noisy inspection data
US-9646379-B1 · May 9, 2017 · US
Dark-Field Inspection Using A Low-Noise Sensor
US-2017048467-A1 · Feb 16, 2017 · US
System and Method for Reducing Radiation-Induced False Counts in an Inspection System
US-2016334516-A1 · Nov 17, 2016 · US
High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensor
US-9460886-B2 · Oct 4, 2016 · US
Wafer inspection with multi-spot illumination and multiple channels
US-9404873-B2 · Aug 2, 2016 · US
Detection of selected defects in relatively noisy inspection data
US-9355440-B1 · May 31, 2016 · US
TDI Sensor in a Darkfield System
US-2016097727-A1 · Apr 7, 2016 · US
Wafer inspection
US-9279774-B2 · Mar 8, 2016 · US
High Resolution High Quantum Efficiency Electron Bombarded CCD Or CMOS Imaging Sensor
US-2016027605-A1 · Jan 28, 2016 · US
Wafer Inspection
US-2015369753-A1 · Dec 24, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 33 |
| Kla Corp | 6 |
| Romanovsky Anatoly | 1 |
| Maleev Ivan | 1 |
| Kavaldjiev Daniel | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 21 |
| G01N21/8851 | 14 |
| G01N21/8806 | 13 |
| G01N21/956 | 9 |
| G01N2021/8887 | 6 |