Deep learning based mode selection for inspection
US-12480890-B2 · Nov 25, 2025 · US
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Bhaskar Kris patents
Bhaskar Kris is listed as an inventor on 52 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Bhaskar Kris |
| Total patents | 52 |
| First publication | Jan 8, 2015 |
| Latest publication | Nov 25, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Defect synthesis and detection via defect generative pre-trained transformer for semiconductor applications
US-2025117925-A1 · Apr 10, 2025 · US
Deep learning based mode selection for inspection
US-2025020598-A1 · Jan 16, 2025 · US
Protecting data sources from different entities for semiconductor yield related applications
US-2024169116-A1 · May 23, 2024 · US
Unsupervised or self-supervised deep learning for semiconductor-based applications
US-2024013365-A9 · Jan 11, 2024 · US
Mode selection and defect detection training
US-11769242-B2 · Sep 26, 2023 · US
Unsupervised or self-supervised deep learning for semiconductor-based applications
US-2023260100-A1 · Aug 17, 2023 · US
3D structure inspection or metrology using deep learning
US-11644756-B2 · May 9, 2023 · US
Knowledge distillation for semiconductor-based applications
US-2023136110-A1 · May 4, 2023 · US
Learnable defect detection for semiconductor applications
US-2023118839-A1 · Apr 20, 2023 · US
Recent patents
Latest publications not already listed above.
Accelerated training of a machine learning based model for semiconductor applications
US-11580375-B2 · Feb 14, 2023 · US
Diagnostic systems and methods for deep learning models configured for semiconductor applications
US-11580398-B2 · Feb 14, 2023 · US
Learnable defect detection for semiconductor applications
US-11551348-B2 · Jan 10, 2023 · US
Multi-controller inspection system
US-11415526-B2 · Aug 16, 2022 · US
3d structure inspection or metrology using deep learning
US-2022043357-A1 · Feb 10, 2022 · US
Mode selection and defect detection training
US-2021366103-A1 · Nov 25, 2021 · US
Multi-controller inspection system
US-2021349038-A1 · Nov 11, 2021 · US
Learnable defect detection for semiconductor applications
US-2020327654-A1 · Oct 15, 2020 · US
Active learning for defect classifier training
US-10713769-B2 · Jul 14, 2020 · US
Generating high resolution images from low resolution images for semiconductor applications
US-10648924-B2 · May 12, 2020 · US
Training a neural network for defect detection in low resolution images
US-10599951-B2 · Mar 24, 2020 · US
Active learning for defect classifier training
US-2019370955-A1 · Dec 5, 2019 · US
Training a neural network for defect detection in low resolution images
US-2019303717-A1 · Oct 3, 2019 · US
Virtual inspection systems for process window characterization
US-10402461-B2 · Sep 3, 2019 · US
Generating simulated images from input images for semiconductor applications
US-10395356-B2 · Aug 27, 2019 · US
Accelerating semiconductor-related computations using learning based models
US-10360477-B2 · Jul 23, 2019 · US
Systems and methods incorporating a neural network and a forward physical model for semiconductor applications
US-10346740-B2 · Jul 9, 2019 · US
Single image detection
US-10186026-B2 · Jan 22, 2019 · US
Image based specimen process control
US-10181185-B2 · Jan 15, 2019 · US
Generating simulated output for a specimen
US-10043261-B2 · Aug 7, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 43 |
| Kla Corp | 16 |
| Kla—Tencor Corp | 1 |
| Kla Tenor Corp | 1 |
| Zhao Guoheng | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 39 |
| G06T7/0004 | 33 |
| G06T2207/20084 | 30 |
| G06T2207/20081 | 30 |
| G06T2207/10061 | 24 |