Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results
US-10198548-B2 · Feb 5, 2019 · US
Benware Robert B is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Benware Robert B |
| Total patents | 3 |
| First publication | Aug 25, 2016 |
| Latest publication | Feb 5, 2019 |
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Mentor Graphics Corp | 3 |
| Sharma Manish | 1 |
| Benware Robert B | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F11/26 | 2 |
| G01R31/31703 | 2 |
| G01R31/3177 | 2 |
| G06F30/398 | 1 |
| G06F2111/08 | 1 |