Simulation apparatus and creation method of thermal equivalent circuit
US-12327074-B2 · Jun 10, 2025 · US
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Ando Daisuke patents
Ando Daisuke is listed as an inventor on 26 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ando Daisuke |
| Total patents | 26 |
| First publication | Dec 10, 2015 |
| Latest publication | Jun 10, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Vehicle lid seal structure
US-12220982-B2 · Feb 11, 2025 · US
Semiconductor device
US-2024105666-A1 · Mar 28, 2024 · US
Semiconductor device
US-2024105665-A1 · Mar 28, 2024 · US
Vehicle lid seal structure
US-2024034145-A1 · Feb 1, 2024 · US
Heat insulating material for battery and battery
US-2023114956-A1 · Apr 13, 2023 · US
Simulation apparatus and creation method of thermal equivalent circuit
US-2023088851-A1 · Mar 23, 2023 · US
Connection device
US-11570918-B2 · Jan 31, 2023 · US
Soundproofing material
US-11535004-B2 · Dec 27, 2022 · US
Connection device
US-2022071034-A1 · Mar 3, 2022 · US
Recent patents
Latest publications not already listed above.
Connection device
US-11202381-B2 · Dec 14, 2021 · US
Connection device
US-2021176877-A1 · Jun 10, 2021 · US
Image inspection apparatus
US-10591285-B2 · Mar 17, 2020 · US
Image inspection apparatus and image inspection method
US-10560634-B2 · Feb 11, 2020 · US
Inspection Apparatus, Inspection Method, And Program
US-2020043157-A1 · Feb 6, 2020 · US
Image inspection apparatus and image inspection method
US-10508994-B2 · Dec 17, 2019 · US
Inspection apparatus, inspection method, and program
US-10489900-B2 · Nov 26, 2019 · US
Soundproofing material
US-2019329524-A1 · Oct 31, 2019 · US
Image Inspection Apparatus And Image Inspection Method
US-2018348144-A1 · Dec 6, 2018 · US
Image Inspection Apparatus
US-2018348146-A1 · Dec 6, 2018 · US
Image Inspection Apparatus And Image Inspection Method
US-2018352163-A1 · Dec 6, 2018 · US
Magnesium alloy that exhibits superelastic effect and/or shape-memory effect
US-2018291483-A1 · Oct 11, 2018 · US
Inspection Apparatus, Inspection Method, And Program
US-2017236269-A1 · Aug 17, 2017 · US
Inspection apparatus, inspection method, and program
US-9683943-B2 · Jun 20, 2017 · US
Pipe cover, pipe structure and vehicle
US-9593798-B2 · Mar 14, 2017 · US
Inspection Apparatus, Inspection Method, And Program
US-2015355103-A1 · Dec 10, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Keyence Co Ltd | 11 |
| Toshiba Kk | 8 |
| Toshiba Electronic Devices & Storage Corp | 8 |
| Nichias Corp | 4 |
| Toyota Motor Co Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/8806 | 9 |
| G06T7/0004 | 9 |
| G01N21/8851 | 9 |
| G06T2207/10152 | 7 |
| G01N21/8803 | 7 |