Overlay measurement between layers of a semiconductor specimen based on center of symmetry (COS) localization
US-12579628-B2 · Mar 17, 2026 · US
This page is not indexed by search engines while we improve data quality.
Alumot Dror patents
Alumot Dror is listed as an inventor on 18 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Alumot Dror |
| Total patents | 18 |
| First publication | Sep 15, 2016 |
| Latest publication | Mar 17, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Image denoising for examination of a semiconductor specimen
US-12511720-B2 · Dec 30, 2025 · US
Shape localization for examining a semiconductor specimen
US-12423798-B2 · Sep 23, 2025 · US
Optimization of a metrology algorithm for examination of semiconductor wafers
US-2025264814-A1 · Aug 21, 2025 · US
Image segmentation for examining a semiconductor specimen
US-2025045904-A1 · Feb 6, 2025 · US
Image denoising for examination of a semiconductor specimen
US-2024153043-A1 · May 9, 2024 · US
Overlay measurement for a semiconductor specimen
US-2024062355-A1 · Feb 22, 2024 · US
Shape localization for examining a semiconductor specimen
US-2024046445-A1 · Feb 8, 2024 · US
Accuracy improvements in optical metrology
US-11862522-B2 · Jan 2, 2024 · US
Device metrology targets and methods
US-11054752-B2 · Jul 6, 2021 · US
Recent patents
Latest publications not already listed above.
Accuracy improvements in optical metrology
US-2021175132-A1 · Jun 10, 2021 · US
Examination of a semiconductor specimen
US-11022566-B1 · Jun 1, 2021 · US
Device metrology targets and methods
US-10571811-B2 · Feb 25, 2020 · US
Overlay control with non-zero offset prediction
US-10409171-B2 · Sep 10, 2019 · US
Device metrology targets and methods
US-2019004438-A1 · Jan 3, 2019 · US
Overlay Control with Non-Zero Offset Prediction
US-2018253017-A1 · Sep 6, 2018 · US
Accuracy improvements in optical metrology
US-2018047646-A1 · Feb 15, 2018 · US
Device metrology targets and methods
US-2016266505-A1 · Sep 15, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 9 |
| Applied Materials Israel Ltd | 9 |
| Kla Corp | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 11 |
| G03F7/70633 | 11 |
| G06T2207/30148 | 8 |
| H10P74/23 | 7 |
| H01L22/12 | 6 |