Transistor nano channel thickness measurement techniques and apparatuses
US-2026082867-A1 · Mar 19, 2026 · US
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Agarwal Navnit patents
Agarwal Navnit is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Agarwal Navnit |
| Total patents | 4 |
| First publication | Mar 7, 2024 |
| Latest publication | Mar 19, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Machine learning-based scatterometry and feed forward techniques for gate-all-around transistors
US-2026052937-A1 · Feb 19, 2026 · US
Machine learning-based scatterometry and feed forward techniques for gate-all-around transistors
US-12374570-B2 · Jul 29, 2025 · US
Machine learning-based scatterometry and feed forward techniques for gate-all-around transistors
US-2024079254-A1 · Mar 7, 2024 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Intel Corp | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P72/0604 | 3 |
| G06N3/08 | 3 |
| G06N3/0499 | 3 |
| G06F18/24 | 3 |
| H01L21/67253 | 3 |