Defect inspection method and defect inspection system
US-2025027886-A1 · Jan 23, 2025 · US
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Patent family 94259672
This patent family groups 1 related publication across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 94259672 |
| Family type | — |
| Earliest priority | Jul 20, 2023 |
| First filing country | US |
| Member publications | 1 |
| Countries | US |
| Representative publication | US2025027886A1 — Defect inspection method and defect inspection system |
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US2025027886A1 — Defect inspection method and defect inspection system (published Jan 23, 2025)
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