Process method for improving reliability of metal gate high-voltage device
US-12424436-B2 · Sep 23, 2025 · US
This patent family groups 2 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 87761176 |
| Family type | — |
| Earliest priority | Feb 28, 2022 |
| First filing country | US |
| Member publications | 2 |
| Countries | US |
| Representative publication | US12424436B2 — Process method for improving reliability of metal gate high-voltage device |
Best representative member for this family based on priority and filing country.
US12424436B2 — Process method for improving reliability of metal gate high-voltage device (published Sep 23, 2025)
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