Flaw inspection device and flaw inspection method
US-10816484-B2 · Oct 27, 2020 · US
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Patent family 59962761
This patent family groups 4 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 59962761 |
| Family type | — |
| Earliest priority | Mar 30, 2016 |
| First filing country | US |
| Member publications | 4 |
| Countries | US |
| Representative publication | US10816484B2 — Flaw inspection device and flaw inspection method |
Representative publication
Best representative member for this family based on priority and filing country.
US10816484B2 — Flaw inspection device and flaw inspection method (published Oct 27, 2020)
Member publications
Related publications in this family.
Flaw inspection device and flaw inspection method
US-2020057003-A1 · Feb 20, 2020 · US
Flaw inspection device and flaw inspection method
US-10466181-B2 · Nov 5, 2019 · US
Flaw inspection device and flaw inspection method
US-2019094155-A1 · Mar 28, 2019 · US