Evaluation device for oxide semiconductor thin film
US-2016223462-A1 · Aug 4, 2016 · US
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Patent family 52665698
This patent family groups 1 related publication across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 52665698 |
| Family type | — |
| Earliest priority | Sep 13, 2013 |
| First filing country | US |
| Member publications | 1 |
| Countries | US |
| Representative publication | US2016223462A1 — Evaluation device for oxide semiconductor thin film |
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US2016223462A1 — Evaluation device for oxide semiconductor thin film (published Aug 4, 2016)
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