Testing integrated circuits using few test probes
US-9442159-B2 · Sep 13, 2016 · US
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Patent family 40292829
This patent family groups 1 related publication across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 40292829 |
| Family type | — |
| Earliest priority | Mar 5, 2008 |
| First filing country | US |
| Member publications | 1 |
| Countries | US |
| Representative publication | US9442159B2 — Testing integrated circuits using few test probes |
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US9442159B2 — Testing integrated circuits using few test probes (published Sep 13, 2016)
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