Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling
US-2026056014-A1 · Feb 26, 2026 · US
Surface alteration
Surface alteration · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J2237/2067 |
| Official title | Surface alteration |
| Display label | Surface alteration |
| Total patents | 40 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2016 | 5 |
| 2017 | 3 |
| 2018 | 8 |
| 2019 | 5 |
| 2020 | 4 |
| 2021 | 2 |
| 2022 | 2 |
| 2023 | 2 |
| 2024 | 3 |
| 2025 | 1 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Conductive fixation for electron microscopy
US-2026045445-A1 · Feb 12, 2026 · US
Conductive fixation for electron microscopy
US-12224154-B2 · Feb 11, 2025 · US
Method and System for Sample Preparation
US-2024426717-A1 · Dec 26, 2024 · US
Specimen imaging systems and methods
US-2024412961-A1 · Dec 12, 2024 · US
Specimen imaging systems and methods
US-12094701-B2 · Sep 17, 2024 · US
Gas injection subsystem for use in an inspection system to inspect a sample by use of charged particles and inspection system having such gas injection subsystem
US-2023402251-A1 · Dec 14, 2023 · US
Method Of Imaging And Milling A Sample
US-2023162945-A1 · May 25, 2023 · US
Specimen imaging systems and methods
US-2022344138-A1 · Oct 27, 2022 · US
Transmission electron microscope provided with at least one ballistic material jet source
US-11239049-B2 · Feb 1, 2022 · US
Volume scanning electron microscopy of serial thick tissue sections with gas cluster milling
US-11177110-B2 · Nov 16, 2021 · US
Transmission electron microscope provided with at least one ballistic material jet source
US-2021241994-A1 · Aug 5, 2021 · US
Conductive fixation for electron microscopy
US-2020373121-A1 · Nov 26, 2020 · US
Method of analyzing surface modification of a specimen in a charged-particle microscope
US-10811223-B2 · Oct 20, 2020 · US
Enhanced FIB-SEM systems for large-volume 3D imaging
US-10600615-B2 · Mar 24, 2020 · US
Method and apparatus for transmission electron microscopy
US-10541108-B2 · Jan 21, 2020 · US
Miniature device for ultra high sensitivity and stability probing in vacuum
US-10520527-B2 · Dec 31, 2019 · US
Volume Scanning Electron Microscopy of Serial Thick Tissue Sections with Gas Cluster Milling
US-2019355550-A1 · Nov 21, 2019 · US
Miniature device for ultra high sensitivity and stability probing in vacuum
US-2019187174-A1 · Jun 20, 2019 · US
Method for acquiring image and ion beam apparatus
US-10276343-B2 · Apr 30, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J2237/2067?
- CPC H01J2237/2067 is the Cooperative Patent Classification code for “Surface alteration.”
- How many patents are filed under CPC H01J2237/2067 (Surface alteration)?
- Our database includes 40 publications tagged with this CPC code.
- Is patent activity under CPC H01J2237/2067 growing?
- Publication counts under this code: 3 in 2024 vs 1 in 2025 (latest complete years).