Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-2026009845-A1 · Jan 8, 2026 · US
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of printed or hybrid circuits
of printed or hybrid circuits · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/306 |
| Official title | of printed or hybrid circuits |
| Display label | of printed or hybrid circuits |
| Total patents | 23 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 1 |
| 2017 | 1 |
| 2021 | 2 |
| 2022 | 4 |
| 2023 | 5 |
| 2024 | 4 |
| 2025 | 4 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-2026011529-A1 · Jan 8, 2026 · US
Metal pattern inspection method and focused ion beam apparatus
US-12456599-B2 · Oct 28, 2025 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-12429520-B2 · Sep 30, 2025 · US
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-12431333-B2 · Sep 30, 2025 · US
Methods and apparatuses for identifying defective electrical connections, and methods for generating a trained computational model
US-2025201634-A1 · Jun 19, 2025 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-2024329128-A1 · Oct 3, 2024 · US
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-2024304414-A1 · Sep 12, 2024 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-12038476-B2 · Jul 16, 2024 · US
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-12020897-B2 · Jun 25, 2024 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-2023358804-A1 · Nov 9, 2023 · US
Metal pattern inspection method and focused ion beam apparatus
US-2023326714-A1 · Oct 12, 2023 · US
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-2023282444-A1 · Sep 7, 2023 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-11668746-B2 · Jun 6, 2023 · US
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-11605526-B2 · Mar 14, 2023 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-2022365134-A1 · Nov 17, 2022 · US
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
US-2022336187-A1 · Oct 20, 2022 · US
Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block
US-11340293-B2 · May 24, 2022 · US
Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell
US-11328899-B2 · May 10, 2022 · US
Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
US-2021096179-A1 · Apr 1, 2021 · US