Wide-bandgap semiconductor layer characterization
US-12078607-B2 · Sep 3, 2024 · US
Testing of discharge tubes (during manufacture H01J9/42) · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/24 |
| Official title | Testing of discharge tubes (during manufacture H01J9/42) |
| Display label | Testing of discharge tubes (during manufacture H01J9/42) |
| Total patents | 21 |
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 5 |
| 2016 | 2 |
| 2017 | 2 |
| 2018 | 3 |
| 2019 | 5 |
| 2020 | 2 |
| 2023 | 1 |
| 2024 | 1 |
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
US-12078607-B2 · Sep 3, 2024 · US
US-2023050640-A1 · Feb 16, 2023 · US
US-10728966-B1 · Jul 28, 2020 · US
US-2020236753-A1 · Jul 23, 2020 · US
US-10514393-B2 · Dec 24, 2019 · US
US-10353016-B2 · Jul 16, 2019 · US
US-10317441-B2 · Jun 11, 2019 · US
US-10274545-B2 · Apr 30, 2019 · US
US-10209294-B2 · Feb 19, 2019 · US
US-10041976-B2 · Aug 7, 2018 · US
US-2018217184-A1 · Aug 2, 2018 · US
US-9983228-B2 · May 29, 2018 · US
US-2017219626-A1 · Aug 3, 2017 · US
US-9599639-B2 · Mar 21, 2017 · US
US-2016252551-A1 · Sep 1, 2016 · US
US-2016084878-A1 · Mar 24, 2016 · US
US-2015355290-A1 · Dec 10, 2015 · US
US-2015268306-A1 · Sep 24, 2015 · US
US-8970220-B2 · Mar 3, 2015 · US
US-8957664-B2 · Feb 17, 2015 · US