Manufacturing method of semiconductor device, inspection device of semiconductor device, and semiconductor device
US-10418292-B2 · Sep 17, 2019 · US
Physics · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/045 |
| Official title | — |
| Display label | Physics (mapped technology topic) |
| Total patents | 101 |
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 7 |
| 2016 | 12 |
| 2017 | 17 |
| 2018 | 20 |
| 2019 | 27 |
| 2020 | 16 |
| 2021 | 2 |
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
US-10418292-B2 · Sep 17, 2019 · US
US-10351083-B2 · Jul 16, 2019 · US
US-2019186380-A1 · Jun 20, 2019 · US
US-10288663-B1 · May 14, 2019 · US
US-2018352864-A1 · Dec 13, 2018 · US
US-2018340970-A1 · Nov 29, 2018 · US
US-2018336292-A1 · Nov 22, 2018 · US
US-2018321297-A1 · Nov 8, 2018 · US
US-2018299134-A1 · Oct 18, 2018 · US
US-10088515-B2 · Oct 2, 2018 · US
US-2018246158-A1 · Aug 30, 2018 · US
US-10054628-B2 · Aug 21, 2018 · US
US-10054626-B2 · Aug 21, 2018 · US
US-10055515-B2 · Aug 21, 2018 · US
US-2018233844-A1 · Aug 16, 2018 · US
US-10044183-B2 · Aug 7, 2018 · US
US-10024902-B2 · Jul 17, 2018 · US
US-9989577-B2 · Jun 5, 2018 · US
US-9982680-B2 · May 29, 2018 · US
US-9939482-B2 · Apr 10, 2018 · US
Answers are generated from the same data shown on this page.