High frequency lock-in thermography using single photon detectors
US-2018180670-A1 · Jun 28, 2018 · US
Non contact-making probes
Non contact-making probes · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R1/07 |
| Official title | Non contact-making probes |
| Display label | Non contact-making probes |
| Total patents | 171 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 25 |
| 2016 | 18 |
| 2017 | 15 |
| 2018 | 15 |
| 2019 | 14 |
| 2020 | 11 |
| 2021 | 14 |
| 2022 | 10 |
| 2023 | 19 |
| 2024 | 11 |
| 2025 | 17 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Apparatus and method for integrated circuit forensics
US-9885745-B2 · Feb 6, 2018 · US
Isolated voltage probe
US-2017370967-A1 · Dec 28, 2017 · US
Method of implementation of peak hold in a phasing voltmeter
US-9804204-B2 · Oct 31, 2017 · US
Non-contact voltage measuring apparatus
US-9791475-B2 · Oct 17, 2017 · US
Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions
US-9746514-B2 · Aug 29, 2017 · US
Contactless signal testing
US-9714979-B2 · Jul 25, 2017 · US
Testing of electronic devices through capacitive interface
US-2017192037-A1 · Jul 6, 2017 · US
Measurement device for measuring voltages along a linear array of voltage sources
US-9647283-B2 · May 9, 2017 · US
Testing of electronic devices through capacitive interface
US-9638715-B2 · May 2, 2017 · US
Apparatus and method for detecting faults in multilayer semiconductors
US-2017074928-A1 · Mar 16, 2017 · US
Non-contact voltage measurement device
US-2017067939-A1 · Mar 9, 2017 · US
Voltage detecting probe and measuring device
US-2017067938-A1 · Mar 9, 2017 · US
Non-contact voltage measurement device
US-2017059619-A1 · Mar 2, 2017 · US
Non-contact voltage measuring apparatus
US-2017038413-A1 · Feb 9, 2017 · US
Radio frequency probe apparatus
US-2017023635-A1 · Jan 26, 2017 · US
Probe assembly and method for contactless electrical characterization of buried conducting layers
US-9535025-B2 · Jan 3, 2017 · US
Apparatus and method for testing electric conductors
US-9523729-B2 · Dec 20, 2016 · US
Contactless signal testing
US-2016356845-A1 · Dec 8, 2016 · US
Systems and methods related to near-field electromagnetic scanners
US-9506968-B2 · Nov 29, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R1/07?
- CPC G01R1/07 is the Cooperative Patent Classification code for “Non contact-making probes.”
- How many patents are filed under CPC G01R1/07 (Non contact-making probes)?
- Our database includes 171 publications tagged with this CPC code.
- Is patent activity under CPC G01R1/07 growing?
- Publication counts under this code: 11 in 2024 vs 17 in 2025 (latest complete years).