Truncated nonlinear interferometer-based atomic force microscopes
US-2021190819-A1 · Jun 24, 2021 · US
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DC mode
DC mode · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q60/36 |
| Official title | DC mode |
| Display label | DC mode |
| Total patents | 9 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity appears stable based on the most recent years.
| Year | Patents |
|---|---|
| 2015 | 4 |
| 2016 | 3 |
| 2019 | 1 |
| 2021 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Dual-probe scanning probe microscope
US-10197595-B2 · Feb 5, 2019 · US
Dual-Probe Scanning Probe Microscope
US-2016274143-A1 · Sep 22, 2016 · US
Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy
US-9395388-B2 · Jul 19, 2016 · US
Dual-probe scanning probe microscope
US-9291639-B2 · Mar 22, 2016 · US
Feedback controller in probe microscope utilizing a switch and a inverter
US-9140720-B2 · Sep 22, 2015 · US
Methods, systems, and computer readable media for dual resonance frequency enhanced electrostatic force microscopy
US-2015241470-A1 · Aug 27, 2015 · US
System and method for high-speed atomic force microscopy with switching between two feedback loops
US-9091705-B2 · Jul 28, 2015 · US
Determation of local contact potential difference by noncontact atomic force microscopy
US-2015121576-A1 · Apr 30, 2015 · US