Device for measuring and/or modifying a surface
US-2024118310-A1 · Apr 11, 2024 · US
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STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q60/04 |
| Official title | STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] |
| Display label | STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] |
| Total patents | 5 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity appears stable based on the most recent years.
| Year | Patents |
|---|---|
| 2016 | 2 |
| 2020 | 1 |
| 2021 | 1 |
| 2024 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Scanning probe microscope with case and elastic body
US-11073535-B2 · Jul 27, 2021 · US
Scanning Probe Microscope
US-2020341027-A1 · Oct 29, 2020 · US
Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample
US-9366694-B2 · Jun 14, 2016 · US
Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Microscope, And Method For Controlling The Distance Between The Local Probe And The Sample
US-2016003866-A1 · Jan 7, 2016 · US