defined by measured X-ray, neutron or electron diffraction data

defined by measured X-ray, neutron or electron diffraction data · Cooperative Patent Classification (CPC)

Chemical and metallurgical processes, compounds, and materials.

Related technology areas

Mapped technology topics for this CPC code.

CPC classification statistics
MetricValue
CPC codeC01P2002/70
Official titledefined by measured X-ray, neutron or electron diffraction data
Display labeldefined by measured X-ray, neutron or electron diffraction data
Total patents705

Filing trend

Year-over-year patent counts classified under this CPC code.

Filing activity over the last five years is growing.

Patents filed per year
YearPatents
201517
201619
201754
201844
201971
202078
202170
202275
202364
202488
2025109
202616

Representative patents

Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.

Frequently asked questions

Answers are generated from the same data shown on this page.

What is CPC C01P2002/70?
CPC C01P2002/70 is the Cooperative Patent Classification code for “defined by measured X-ray, neutron or electron diffraction data.”
How many patents are filed under CPC C01P2002/70 (defined by measured X-ray, neutron or electron diffraction data)?
Our database includes 705 publications tagged with this CPC code.
Is patent activity under CPC C01P2002/70 growing?
Publication counts under this code: 88 in 2024 vs 109 in 2025 (latest complete years).