Fixture for in situ electromigration testing during X-ray microtomography
US-9952272-B2 · Apr 24, 2018 · US
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Chawla Nikhilesh — Physics
Chawla Nikhilesh holds 2 patents in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Chawla Nikhilesh |
| Technology | Physics |
| Patents in slice | 2 |
| Recent patents in slice | 0 |
| First year | 2017 |
| Last year | 2018 |
Representative patents
Notable publications linking Chawla Nikhilesh to Physics.
Fixture for in situ electromigration testing during X-ray microtomography
US-9952272-B2 · Apr 24, 2018 · US
Modular high resolution X-ray computed tomography system
US-9791385-B2 · Oct 17, 2017 · US
Recent filings
Latest patents from Chawla Nikhilesh in Physics.
Fixture for in situ electromigration testing during X-ray microtomography
US-9952272-B2 · Apr 24, 2018 · US
Fixture for in situ electromigration testing during X-ray microtomography
US-9952272-B2 · Apr 24, 2018 · US
Modular high resolution X-ray computed tomography system
US-9791385-B2 · Oct 17, 2017 · US
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