Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
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Sievers Torsten — Physics
Sievers Torsten holds 2 patents in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Sievers Torsten |
| Technology | Physics |
| Patents in slice | 2 |
| Recent patents in slice | 0 |
| First year | 2016 |
| Last year | 2017 |
Representative patents
Notable publications linking Sievers Torsten to Physics.
Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
Method of operating a navigation system to provide geographic location information
US-9279695-B2 · Mar 8, 2016 · US
Method of operating a navigation system to provide geographic location information
US-9279695-B2 · Mar 8, 2016 · US
Recent filings
Latest patents from Sievers Torsten in Physics.
Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
Method of operating a navigation system to provide geographic location information
US-9279695-B2 · Mar 8, 2016 · US
Method of operating a navigation system to provide geographic location information
US-9279695-B2 · Mar 8, 2016 · US
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