Microscopic examination of an object using a sequence of optical microscopy and particle beam microscopy
US-9581799-B2 · Feb 28, 2017 · US
Sievers Torsten holds 2 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 2 |
| Recent patents | 0 |
| First publication | Mar 8, 2016 |
| Latest publication | Feb 28, 2017 |
Year-over-year patent counts for this assignee.
Latest publications where this party is an assignee.
Representative or frequently cited publications from precomputed assignee stats.
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Physics | 2 |
| Electricity | 1 |