Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
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Matsuoka Shinya — Physics
Matsuoka Shinya holds 1 patent in Physics, with representative filings summarized below.
| Metric | Value |
|---|---|
| Company | Matsuoka Shinya |
| Technology | Physics |
| Patents in slice | 1 |
| Recent patents in slice | 0 |
| First year | 2017 |
| Last year | 2017 |
Representative patents
Notable publications linking Matsuoka Shinya to Physics.
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Recent filings
Latest patents from Matsuoka Shinya in Physics.
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
Sample analyzing device and sample analyzing method
US-9557326-B2 · Jan 31, 2017 · US
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