Method and apparatus for inspecting a substrate
US-9529279-B2 · Dec 27, 2016 · US
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Bertsche Kirk patents
Bertsche Kirk holds 2 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 2 |
| Recent patents | 0 |
| First publication | Oct 27, 2015 |
| Latest publication | Dec 27, 2016 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Method and apparatus for inspecting a substrate
US-9170503-B2 · Oct 27, 2015 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Method and apparatus for inspecting a substrate
US-9529279-B2 · Dec 27, 2016 · US
Method and apparatus for inspecting a substrate
US-9170503-B2 · Oct 27, 2015 · US
Top CPC classifications
Most common classification codes in this portfolio.
| CPC | Patents |
|---|---|
| G03F7/70616 | 2 |
| G03F1/86 | 2 |
| G01N23/2252 | 2 |
| G01N21/95607 | 2 |
| H01J2237/2817 | 2 |
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Physics | 2 |
| Electricity | 2 |